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Circuits of Ordinary Capacitors

James U. Gleaton (), David Han, James D. Lynch, Hon Keung Tony Ng and Fabrizio Ruggeri
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David Han: University of Texas at San Antonio, Management of Science and Statistics
James D. Lynch: University of South Carolina, Department of Statistics
Hon Keung Tony Ng: Bentley University, Department of Mathematical Sciences
Fabrizio Ruggeri: Consiglio Nazionale delle Ricerche, Istituto di Matematica Applicata e Tecnologie Informatiche

Chapter Chapter 9 in Fiber Bundles, 2022, pp 103-112 from Springer

Abstract: Abstract In this chapter, we illustrate how the BD distributional behavior of ordinary capacitors affects that of a series circuit of such capacitors. In Sect. 9.1, we investigate the VBD of the circuit when the VBD distribution is Weibull. The parameters are based on the earlier analysis of Kim and Lee’s Figure 6 data for illustrative purposes even though the data is not for ordinary capacitors but for thin dielectrics.

Date: 2022
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Persistent link: https://EconPapers.repec.org/RePEc:spr:sprchp:978-3-031-14797-5_9

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DOI: 10.1007/978-3-031-14797-5_9

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