Applications of rich measure spaces formed from nonstandard models

Peter Loeb ()
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Peter Loeb: University of Illinois, Department of Mathematics

Chapter 14 in The Strength of Nonstandard Analysis, 2007, pp 206-216 from Springer

Abstract: Abstract We review some recent work by Yeneng Sun and the author. Sun’s work shows that there are results, some used for decades without a rigourous foundation, that arc only true for spaces with the rich structure of Loeb measure spaces. His joint work with the author uses that structure to extend an important result on the purification of measure valued maps.

Keywords: Internal Product; Outer Measure; Nonstandard Model; Uniform Probability Measure; Pairwise Independence (search for similar items in EconPapers)
Date: 2007
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Persistent link: https://EconPapers.repec.org/RePEc:spr:sprchp:978-3-211-49905-4_14

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DOI: 10.1007/978-3-211-49905-4_14

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