Bottleneck Detection Method Based on Production Line Information for Semiconductor Manufacturing System

Xiao-yu Yu (), Fei Qiao and Yu-min Ma
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Xiao-yu Yu: TongJi University
Fei Qiao: TongJi University
Yu-min Ma: TongJi University

Chapter Chapter 22 in The 19th International Conference on Industrial Engineering and Engineering Management, 2013, pp 209-218 from Springer

Abstract: Abstract Semiconductor wafer fabrication system is a typical complex manufacturing system, since it has large-scale, reentrant, multi-objective, uncertain and other characteristics. It’s too difficult to achieve the capacity balance to lead the existence of the bottleneck. According to the theory of TOC, the accurate detection of bottleneck is the key to implement DBR thought. For the characteristics of semiconductor production line, this paper proposes a bottleneck detection method based on the starvation and blockage information of the production line. The method is verified on HP-24 model by simulation. Compared to the relative load method, the equipment utilization law and the queue length method; the experimental results show that this method makes performance better than them.

Keywords: Bottleneck detection; DBR; Production line; Reentrant (search for similar items in EconPapers)
Date: 2013
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Persistent link: https://EconPapers.repec.org/RePEc:spr:sprchp:978-3-642-38391-5_22

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DOI: 10.1007/978-3-642-38391-5_22

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