Measurement of Paint Layer Thickness with Photothermal Infrared Radiometry

A. K. Louis, P. Dörr, C. Gruss and H. Petry
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A. K. Louis: Institut für Angewandte Mathematik, Universität des Saarlandes
P. Dörr: Institut für Angewandte Mathematik, Universität des Saarlandes
C. Gruss: Phototherm Dr. Petry GmbH
H. Petry: Phototherm Dr. Petry GmbH

A chapter in Mathematics — Key Technology for the Future, 2003, pp 460-471 from Springer

Abstract: Abstract Photothermal infrared radiometry has been used for the measurement of thermo-physical, optical and geometrical properties of multi-layered samples of paint on a metalic substrate. A special data-normalization is applied to reduce the number of sensitive parameters which makes the identification task for the remaining parameters easier. The normalization stabilizes the evaluation of the photothermal signal and makes the infrared radiometry more attractive for applications in the industrial environment. It is shown that modelling and multi-parameter- fitting can be applied successfully to the normalized data for the determination of layer thicknesses. A second approach is presented to verify the adaptability of reconstruction algorithms for thickness measurements. An algorithm which uses the affinity of the thermal waves to the acoustic waves and the inverse scattering problem demonstrates the applicability in general.

Keywords: Excitation Frequency; Thermal Wave; Approximative Inverse; Inverse Scatter Problem; Harmonic Part (search for similar items in EconPapers)
Date: 2003
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Persistent link: https://EconPapers.repec.org/RePEc:spr:sprchp:978-3-642-55753-8_37

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DOI: 10.1007/978-3-642-55753-8_37

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