Likelihood Ratio Test

Pradip Kumar Sahu, Santi Ranjan Pal and Ajit Kumar Das
Additional contact information
Pradip Kumar Sahu: Bidhan Chandra Krishi Viswavidyalaya, Department of Agricultural Statistics
Santi Ranjan Pal: Bidhan Chandra Krishi Viswavidyalaya, Department of Agricultural Statistics
Ajit Kumar Das: Bidhan Chandra Krishi Viswavidyalaya, Department of Agricultural Statistics

Chapter Chapter 4 in Estimation and Inferential Statistics, 2015, pp 103-129 from Springer

Abstract: Abstract In the previousLikelihood Ratio Test chapter, we have seen that UMP or UMP-unbiased tests exist only for some special families of distributions, while they do not exist for other families.

Keywords: Likelihood Ratio Test Statistic; Critical regionCritical Region; Univariate Normal Population; Involving Nuisance Parameters; Generated Test Problems (search for similar items in EconPapers)
Date: 2015
References: Add references at CitEc
Citations:

There are no downloads for this item, see the EconPapers FAQ for hints about obtaining it.

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:spr:sprchp:978-81-322-2514-0_4

Ordering information: This item can be ordered from
http://www.springer.com/9788132225140

DOI: 10.1007/978-81-322-2514-0_4

Access Statistics for this chapter

More chapters in Springer Books from Springer
Bibliographic data for series maintained by Sonal Shukla () and Springer Nature Abstracting and Indexing ().