Classification Based Reliability Growth Prediction on Data Generated by Multiple Independent Processes

Vishwas M Bhat (), Rajesh P Mishra (), Sainarayanan Sundarakrishna () and Ayon Chakraborty ()
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Vishwas M Bhat: Birla Institute of Technology and Sciences
Rajesh P Mishra: Birla Institute of Technology and Sciences
Sainarayanan Sundarakrishna: Engineering Design Center India
Ayon Chakraborty: James Cook University Singapore

Chapter 48 in Proceedings of the International Conference on Managing the Asian Century, 2013, pp 429-439 from Springer

Abstract: Abstract Reliability Growth is a modeling process for product quality characterization over the lifespan for both hardware and software products and has been explained by multiple models like Duane, Crow-AMSAA, Lloyd Lipow etc. Our research proposes a framework for case-based/scenario based model estimation and prediction, by supervised learning of historical data. In this proposed framework, the case base is generated from historical data and Crow Model is applied in a novel sense to extract information from the historically labeled occurrences. With our framework, we draw in a comparative advantage over the traditional predictive modeling using a Crow’s Growth Model.

Keywords: Reliability growth; NHPP; Case; Wise; Independant poisson processes; Monte-carlo; Probablistic model (search for similar items in EconPapers)
Date: 2013
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DOI: 10.1007/978-981-4560-61-0_48

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