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MODELING MULTIVARIATE CROP YIELD DENSITIES WITH FREQUENT EXTREME EVENTS

Shu-Ling Chen and Mario Miranda ()

No 19970, 2004 Annual meeting, August 1-4, Denver, CO from American Agricultural Economics Association (New Name 2008: Agricultural and Applied Economics Association)

Abstract: Measuring the lower tail of a crop yield distribution is important for managing agricultural production risk and rating crop insurance. Common parametric techniques encounter difficulties when attempting to model extreme yield events. We evaluate and compare alternative models based on our candidate distributions for high risk counties.

Keywords: Research; Methods/; Statistical; Methods (search for similar items in EconPapers)
Pages: 16
Date: 2004
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Persistent link: https://EconPapers.repec.org/RePEc:ags:aaea04:19970

DOI: 10.22004/ag.econ.19970

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