Modeling the bias of digital data: an approach to combining digital and survey data to estimate and predict migration trends

Yuan Hsiao, Lee Fiorio, Jonathan Wakefield and Emilio Zagheni
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Yuan Hsiao: Max Planck Institute for Demographic Research, Rostock, Germany
Emilio Zagheni: Max Planck Institute for Demographic Research, Rostock, Germany

No WP-2020-019, MPIDR Working Papers from Max Planck Institute for Demographic Research, Rostock, Germany

Keywords: USA; computational demography; digital demography; migration; migration measurement (search for similar items in EconPapers)
JEL-codes: J1 Z0 (search for similar items in EconPapers)
Pages: 28 pages
Date: 2020
New Economics Papers: this item is included in nep-ore and nep-pay
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Persistent link: https://EconPapers.repec.org/RePEc:dem:wpaper:wp-2020-019

DOI: 10.4054/MPIDR-WP-2020-019

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