The global technology map: tracking patterns of related and unrelated technological invention by multinational firms

Antoine Schoen (), Floortje Alkemade (), Gaston Heimeriks, Jean-Philippe Cointet (), Lionel Villard () and Patricia Laurens ()
Additional contact information
Antoine Schoen: LISIS - Laboratoire Interdisciplinaire Sciences, Innovations, Sociétés - INRA - Institut National de la Recherche Agronomique - UPEM - Université Paris-Est Marne-la-Vallée - ESIEE Paris - CNRS - Centre National de la Recherche Scientifique
Jean-Philippe Cointet: IFRIS - Institut francilien recherche, innovation et société - INRA - Institut National de la Recherche Agronomique - EHESS - École des hautes études en sciences sociales - OST - UPEM - Université Paris-Est Marne-la-Vallée - M.E.N.E.S.R. - Ministère de l'Education nationale, de l’Enseignement supérieur et de la Recherche - ESIEE Paris - CNRS - Centre National de la Recherche Scientifique
Lionel Villard: LISIS - Laboratoire Interdisciplinaire Sciences, Innovations, Sociétés - INRA - Institut National de la Recherche Agronomique - UPEM - Université Paris-Est Marne-la-Vallée - ESIEE Paris - CNRS - Centre National de la Recherche Scientifique
Patricia Laurens: LISIS - Laboratoire Interdisciplinaire Sciences, Innovations, Sociétés - INRA - Institut National de la Recherche Agronomique - UPEM - Université Paris-Est Marne-la-Vallée - ESIEE Paris - CNRS - Centre National de la Recherche Scientifique

Post-Print from HAL

Date: 2015-06-01
References: Add references at CitEc
Citations:

Published in European Meeting on Applied Evolutionary Economics (EMAEE), Jun 2015, Maastricht, Netherlands

There are no downloads for this item, see the EconPapers FAQ for hints about obtaining it.

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:hal:journl:hal-01775124

Access Statistics for this paper

More papers in Post-Print from HAL
Bibliographic data for series maintained by CCSD ().