Market coverage of patent portfolios in MNE: Do patterns of R&D internationalisation matter ?

Patricia Laurens (), Antoine Schoen (), Christian Le Bas (), Lionel Villard () and Philippe Larédo ()
Additional contact information
Patricia Laurens: LISIS - Laboratoire Interdisciplinaire Sciences, Innovations, Sociétés - INRA - Institut National de la Recherche Agronomique - UPEM - Université Paris-Est Marne-la-Vallée - ESIEE Paris - CNRS - Centre National de la Recherche Scientifique
Antoine Schoen: LISIS - Laboratoire Interdisciplinaire Sciences, Innovations, Sociétés - INRA - Institut National de la Recherche Agronomique - UPEM - Université Paris-Est Marne-la-Vallée - ESIEE Paris - CNRS - Centre National de la Recherche Scientifique
Christian Le Bas: ESDES - ESDES, Lyon Business School - UCLy - UCLy - UCLy (Lyon Catholic University)
Lionel Villard: LISIS - Laboratoire Interdisciplinaire Sciences, Innovations, Sociétés - INRA - Institut National de la Recherche Agronomique - UPEM - Université Paris-Est Marne-la-Vallée - ESIEE Paris - CNRS - Centre National de la Recherche Scientifique
Philippe Larédo: IFRIS - Institut francilien recherche, innovation et société - INRA - Institut National de la Recherche Agronomique - EHESS - École des hautes études en sciences sociales - OST - UPEM - Université Paris-Est Marne-la-Vallée - M.E.N.E.S.R. - Ministère de l'Education nationale, de l’Enseignement supérieur et de la Recherche - ESIEE Paris - CNRS - Centre National de la Recherche Scientifique

Post-Print from HAL

Date: 2015-09-02
References: Add references at CitEc
Citations:

Published in Science and Technology Indicators (STI), Sep 2015, Lugano, Switzerland

There are no downloads for this item, see the EconPapers FAQ for hints about obtaining it.

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:hal:journl:hal-01775144

Access Statistics for this paper

More papers in Post-Print from HAL
Bibliographic data for series maintained by CCSD ().