EconPapers    
Economics at your fingertips  
 

Measuring organizational culture: A two nation post-hoc analysis of a cultural compatibility index

John F. Veiga, Michael Lubatkin, Roland Calori and Philippe Véry
Additional contact information
John F. Veiga: UCONN - University of Connecticut
Michael Lubatkin: EM - EMLyon Business School, UCONN - University of Connecticut
Roland Calori: EM - EMLyon Business School
Philippe Véry: EDHEC - EDHEC Business School - UCL - Université catholique de Lille

Post-Print from HAL

Abstract: Though the concept of `culture clash' has been widely discussed and written about in the context of mergers and acquisitions, the literature has been relatively silent about how to empirically measure this phenomenon. Given the difficulties associated with developing and testing such a measure - especially gaining access to sufficient numbers of firms which have recently experienced a merger - it is not surprising that little has been done. In this paper, we present a post-hoc analysis of a cultural compatibility index that was developed as part of a multi-study survey that we conducted. In addition, we provide evidence of the measure's integrity in two different national cultures. The analysis is based on a survey of executives of acquired British and French firms as to their perceptions of compatibility with the organizational values of the buying firms. We found evidence to suggest that the measure is a reliable and valid congruence index within and across national contexts.

Date: 2000-01-01
References: Add references at CitEc
Citations: View citations in EconPapers (10)

Published in Human Relations, 2000, 53 (4), 539-557 p. ⟨10.1177/0018726700534004⟩

There are no downloads for this item, see the EconPapers FAQ for hints about obtaining it.

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:hal:journl:hal-02311644

DOI: 10.1177/0018726700534004

Access Statistics for this paper

More papers in Post-Print from HAL
Bibliographic data for series maintained by CCSD ().

 
Page updated 2025-03-19
Handle: RePEc:hal:journl:hal-02311644