Using neutral network analysis to uncover the trace effects of national culture

John F. Veiga, Michael Lubatkin, Roland Calori, Philippe Véry and Alex Tung
Additional contact information
John F. Veiga: UCONN - University of Connecticut
Michael Lubatkin: UCONN - University of Connecticut
Roland Calori: EM - EMLyon Business School
Philippe Véry: EDHEC - EDHEC Business School - UCL - Université catholique de Lille
Alex Tung: UCONN - University of Connecticut

Post-Print from HAL

Abstract: The primary objective of this paper is to demonstrate the usefulness of an artificial intelligence technique known as neural network analysis as an aid to uncovering the underlying patterns, or trace effects, of national culture. To make our case, we provide an application of the technique's pattern recognition capability utilizing survey data from top executives in French and British firms. We conclude by interpreting the trace effects found and encouraging the use of this tool by cross-cultural researchers in the future.

Date: 2000-06-01
References: Add references at CitEc
Citations: View citations in EconPapers (6)

Published in Journal of International Business Studies, 2000, 31 (2), 223-238 p. ⟨10.1057/palgrave.jibs.8490903⟩

There are no downloads for this item, see the EconPapers FAQ for hints about obtaining it.

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:hal:journl:hal-02311647

DOI: 10.1057/palgrave.jibs.8490903

Access Statistics for this paper

More papers in Post-Print from HAL
Bibliographic data for series maintained by CCSD ().