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Towards a Novel Comparison Framework of Digital Maturity Assessment Models

B. Cognet, J.-P. Pernot, L. Rivest, C. Danjou, T. Wuest, H. Kärkkäinen and M. Lafleur
Additional contact information
B. Cognet: ETS - Ecole de Technologie Supérieure [Montréal]
J.-P. Pernot: LISPEN - Laboratoire d’Ingénierie des Systèmes Physiques et Numériques - Arts et Métiers Sciences et Technologies
L. Rivest: ETS - Ecole de Technologie Supérieure [Montréal]
C. Danjou: EPM - École Polytechnique de Montréal
T. Wuest: Industrial and Management Systems Engineering [Morgantown] - West Virginia University [Morgantown]
H. Kärkkäinen: TUT - Tampere University of Technology [Tampere]
M. Lafleur: IRCELYON - Institut de recherches sur la catalyse et l'environnement de Lyon - UCBL - Université Claude Bernard Lyon 1 - Université de Lyon - INC-CNRS - Institut de Chimie - CNRS Chimie - CNRS - Centre National de la Recherche Scientifique

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Abstract: The fourth industrial revolution is forcing companies to rethink their status quo – creating a need to assess their digital maturity as a basis for improvements. As a result, there is a variety of maturity models available in the literature. This paper introduces a novel comparison framework designed to compare different digital maturity assessment models. Our framework has several steps: reverse engineering of criteria from existing models, criteria matching analysis, as well as computation of the coverage and spread ratios. These two metrics characterize respectively the similarity of two maturity models, and the spread between them. We tested the proposed approach with two well-known maturity self-assessment approaches, namely the IMPULS and PwC methods. From our analysis, we were able to derive several insights that will help to develop a new maturity model specifically dedicated to support SMEs in the aerospace industry and manufacturing sector.

Keywords: Industry 4.0; Smart manufacturing; Digitalization; Maturity models; Comparison framework; Coverage and spread ratios; Assessment (search for similar items in EconPapers)
Date: 2019-07-08
Note: View the original document on HAL open archive server: https://hal.science/hal-04021877v1
References: View complete reference list from CitEc
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Published in 16th IFIP International Conference on Product Lifecycle Management (PLM), Jul 2019, Moscow, Russia. pp.58-71, ⟨10.1007/978-3-030-42250-9_6⟩

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Persistent link: https://EconPapers.repec.org/RePEc:hal:journl:hal-04021877

DOI: 10.1007/978-3-030-42250-9_6

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