EconPapers    
Economics at your fingertips  
 

Stock profiling using time–frequency-varying systematic risk measure

Roman Mestre

Post-Print from HAL

Abstract: Abstract This study proposes a wavelets approach to estimating time–frequency-varying betas in the capital asset pricing model (CAPM) framework. The dynamic of systematic risk across time and frequency is analyzed to investigate stock risk-profile robustness. Furthermore, we emphasize the effect of an investor's investment horizon on the robustness of portfolio characteristics. We use a daily panel of French stocks from 2012 to 2022. Results show that varying systematic risk varies in time and frequency, and that its short and long-run evolutions differ. We observe differences in short and long dynamics, indicating that a stock's betas differently fluctuate to early announcements or signs of events. However, short-run and long-run betas exhibit similar dynamics during persistent shocks. Betas are more volatile during times of crisis, resulting in greater or lesser robustness of risk profiles. Significant differences exist in short-run and long-run risk profiles, implying a different asset allocation. We conclude that the standard CAPM assumes short-run investment. Then, investors should consider time–frequency CAPM to perform systematic risk analysis and portfolio allocation.

Date: 2023-12
References: Add references at CitEc
Citations:

Published in Financial Innovation, 2023, 9 (1), pp.52. ⟨10.1186/s40854-023-00457-7⟩

There are no downloads for this item, see the EconPapers FAQ for hints about obtaining it.

Related works:
Journal Article: Stock profiling using time–frequency-varying systematic risk measure (2023) Downloads
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:hal:journl:hal-04058285

DOI: 10.1186/s40854-023-00457-7

Access Statistics for this paper

More papers in Post-Print from HAL
Bibliographic data for series maintained by CCSD ().

 
Page updated 2025-03-19
Handle: RePEc:hal:journl:hal-04058285