Technostress appraisal: proposal for a measurement scale

Alain Cucchi ()
Additional contact information
Alain Cucchi: CEMOI - Centre d'Économie et de Management de l'Océan Indien - UR - Université de La Réunion

Post-Print from HAL

Date: 2020-06-10
References: Add references at CitEc
Citations:

Published in 25ème Conférence Internationale de l’Association Information et Management (AIM), Association Information et Management (AIM), Jun 2020, Marrakech, Morocco

There are no downloads for this item, see the EconPapers FAQ for hints about obtaining it.

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:hal:journl:hal-04570272

Access Statistics for this paper

More papers in Post-Print from HAL
Bibliographic data for series maintained by CCSD ().