Returns to Scale on Nonparametric Deterministic Technologies: Simplifying Goodness-of-Fit Methods Using Operations on Technologies Returns to scale on nonparametric deterministic technologies: Simplifying goodness-of-fit methods using operations on technologies

Walter Briec () and Vanden-Eeckaut Kristiaan Kerstens Hervé Leleu Philippe
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Walter Briec: UPVD - Université de Perpignan Via Domitia

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Abstract: Thepurpose of this short article is to simplify goodness-of-fitmethods to obtain qualitative information about returns to scalefor individual observations. Traditional and new goodness-of-fitmethods developed for estimating returns to scale on nonparametricdeterministic reference technologies are reviewed. Using compositionrules for technologies with specific returns to scale assumptions,we show how these goodness-of-fit methods can be simplified inthe case of convex technologies (Data Envelopment Analysis (DEA)models).

Date: 2000-11-01
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Published in Journal of Productivity Analysis, 2000, 14 (3), pp.267-274

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Persistent link: https://EconPapers.repec.org/RePEc:hal:journl:hal-05623407

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