The technological quality of patents: a graph theoretic approach

Didier Lebert () and Sana Elouaer-Mrizak ()
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Didier Lebert: UEA - Unité d'Économie Appliquée - ENSTA Paris - École Nationale Supérieure de Techniques Avancées - IP Paris - Institut Polytechnique de Paris, CRG I3 - Centre de recherche en gestion i3 - X - École polytechnique - IP Paris - Institut Polytechnique de Paris - Université Paris-Saclay - I3 - Institut interdisciplinaire de l’innovation - CNRS - Centre National de la Recherche Scientifique
Sana Elouaer-Mrizak: ISI - Centre de recherche sur l’Innovation et les Stratégies Industrielles - ULCO - Université du Littoral Côte d'Opale

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Date: 2021-09-08
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Published in 16th Annual Conference of the EPIP Association - IP and the Future of Innovation, Sep 2021, Madrid, Spain

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Persistent link: https://EconPapers.repec.org/RePEc:hal:journl:halshs-03344198

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