EconPapers    
Economics at your fingertips  
 

Scarring effects of the first labour market experience: A sibling based analysis

Oskar Skans

No 2004:14, Working Paper Series from IFAU - Institute for Evaluation of Labour Market and Education Policy

Abstract: The paper studies the relationship between teenagers’ first labour market experience and subsequent labour market performance using data on all Swedish youths graduating from vocational high school programmes in 1991–94. Sibling fixed-effects combined with detailed data on high school programmes, grades and work experience during high school are used in order to identify the causal long-run effects of experiencing unemployment subsequent to graduation. The results show a 3 percentage-points increase in the unemployment probability and a 17 % reduction in annual earnings after 5 years due to post-graduation unemployment. The results thus show that teenage labour market failure is in fact costly even though most teenagers have relatively short unemployment spells.

Keywords: Youth unemployment; scarring; state dependence; siblings (search for similar items in EconPapers)
JEL-codes: J64 (search for similar items in EconPapers)
Pages: 43 pages
Date: 2004-11-10
References: View references in EconPapers View complete reference list from CitEc
Citations: View citations in EconPapers (22)

Downloads: (external link)
http://www.ifau.se/upload/pdf/se/2004/wp04-14.pdf (application/pdf)
Our link check indicates that this URL is bad, the error code is: 404 Not Found (http://www.ifau.se/upload/pdf/se/2004/wp04-14.pdf [301 Moved Permanently]--> https://www.ifau.se/upload/pdf/se/2004/wp04-14.pdf)

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:hhs:ifauwp:2004_014

Access Statistics for this paper

More papers in Working Paper Series from IFAU - Institute for Evaluation of Labour Market and Education Policy IFAU, P O Box 513, SE-751 20 Uppsala, Sweden. Contact information at EDIRC.
Bibliographic data for series maintained by Ali Ghooloo ( this e-mail address is bad, please contact ).

 
Page updated 2025-03-31
Handle: RePEc:hhs:ifauwp:2004_014