Technological catching-up and growth convergence among US industries

Jean-Philippe Boussemart, Hervé Leleu, Edward Mensah () and Karina Shitikova ()
Additional contact information
Edward Mensah: University of Illinois at Chicago and IÉSEG School of Management
Karina Shitikova: IÉSEG School of Management (LEM-CNRS 9221)

No 2017-EQM-07, Working Papers from IESEG School of Management

Abstract: Using a non-parametric programming framework, we analyze input-output ratio convergence and technical efficiency catching-up among 63 North American industries over the period 1987-2014. We first separate efficiency gaps into two components: a technical efficiency effect taking into account industry size heterogeneity and a structural component which highlights the impacts of an input-output deepening or expanding effect on technological transfer over time. Secondly, a panel data analysis is performed to link input and output price evolutions with changes in technical efficiencies and input-output mixes. Results clearly show that convergence is observed for both technical and structural components. The impact of these convergence processes on the US economy is estimated at around 0.64% of additional growth. Moreover, these two convergence processes have positive influence onto final demand prices and profitability but negative impact onto suppliers’ prices while no effect can be established on employees or capital providers’ remunerations.

Pages: 26 pages
Date: 2017-09
New Economics Papers: this item is included in nep-eff and nep-tid
References: Add references at CitEc
Citations:

Downloads: (external link)
https://www.ieseg.fr/wp-content/uploads/2012/03/2017-EQM-07_Boussemart.pdf (application/pdf)

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:ies:wpaper:e201707

Access Statistics for this paper

More papers in Working Papers from IESEG School of Management Contact information at EDIRC.
Bibliographic data for series maintained by Lies BOUTEN ().