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Incidental Trends and the Power of Panel Unit Root Tests

Hyungsik Moon (), Benoit Perron () and Peter Phillips ()

No 05.38, IEPR Working Papers from Institute of Economic Policy Research (IEPR)

Abstract: The asymptotic local power of various panel unit root tests are investigated. The (Gaussian) power envelope is obtained under homogeneous and heterogeneous alternatives. The envelope is compared with the asymptotic power functions for the pooled t- test, the Ploberger-Phillips (2002) test, and a point optimal test in neighborhoods of unity that are of order n^(1/4)T^(-1) and n^(1/2)T^(-1); depending on whether or not incidental trends are extracted from the panel data. In the latter case, when the alternative hypothesis is homogeneous across individuals, it is shown that the point optimal test and the Ploberger-Phillips test both achieve the power envelope and are uniformly most powerful, in contrast to point optimal unit root tests for time series. Some simulations examining the finite sample performance of the tests are reported.

Keywords: Asymptotic power envelope; common point optimal test; heterogeneous alternatives; incidental trends; local to unity; power function; panel unit root test (search for similar items in EconPapers)
JEL-codes: C22 C23 (search for similar items in EconPapers)
New Economics Papers: this item is included in nep-ets
Date: 2005-10
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Related works:
Journal Article: Incidental trends and the power of panel unit root tests (2007) Downloads
Working Paper: Incidental Trends and the Power of Panel Unit Root Tests (2004) Downloads
Working Paper: Incidental Trends and the Power of Panel Unit Root Tests (2003) Downloads
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