The value and indicator function of patents

Rainer Frietsch, Ulrich Schmoch, Baart Van Looy, J. P. Walsh, R. Devroede, M. Du Plessis, T. Jung, Y. Meng, Peter Neuhäusler, B. Peeters and T. Schubert

No 15-2010, Studien zum deutschen Innovationssystem from Expertenkommission Forschung und Innovation (EFI) - Commission of Experts for Research and Innovation, Berlin

Date: 2010
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