Optimality of type I orthogonal arrays for cross-over models with correlated errors

Joachim Kunert and R. J. Martin

No 1998,06, Technical Reports from Technische Universität Dortmund, Sonderforschungsbereich 475: Komplexitätsreduktion in multivariaten Datenstrukturen

Abstract: We show that binary designs for cross-over models obtained from orthogonal arrays are universally optimal under correlated errors.

Keywords: Carry-over effect; Change-over design; Cross-over design; Dependent observations; Generalized least-squares; Optimal design; Orthogonal arrays; Repeated measurements design (search for similar items in EconPapers)
Date: 1998
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Persistent link: https://EconPapers.repec.org/RePEc:zbw:sfb475:199806

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