Bayesian analysis of competing risks with partially masked cause of failure

Sanjib Basu, Ananda Sen and Mousumi Banerjee

Journal of the Royal Statistical Society Series C, 2003, vol. 52, issue 1, 77-93

Abstract: Summary. Bayesian analysis of system failure data from engineering applications under a competing risks framework is considered when the cause of failure may not have been exactly identified but has only been narrowed down to a subset of all potential risks. In statistical literature, such data are termed masked failure data. In addition to masking, failure times could be right censored owing to the removal of prototypes at a prespecified time or could be interval censored in the case of periodically acquired readings. In this setting, a general Bayesian formulation is investigated that includes most commonly used parametric lifetime distributions and that is sufficiently flexible to handle complex forms of censoring. The methodology is illustrated in two engineering applications with a special focus on model comparison issues.

Date: 2003
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