Reliability Test Plans for Exponentiated Log-Logistic Distribution

Rosaiah K., Kantam R. R. L. and Kumar Santosh
Additional contact information
Rosaiah K.: Department of Statistics, Acharya Nagarjuna University, Guntur - 522 510 (Andhra Pradesh), India
Kantam R. R. L.: Department of Statistics, Acharya Nagarjuna University, Guntur - 522 510 (Andhra Pradesh), India
Kumar Santosh: Department of Statistics, Nalanda Degree College, Vijayawada - 520 010 (Andhra Pradesh), India

Stochastics and Quality Control, 2006, vol. 21, issue 2, 279-289

Abstract: A generalization of the log-logistic distribution called exponentiated log-logistic distribution (in lines of exponentiated Weibull distribution suggested by Mudholkar and Srivastava [Technometrics 37: 436-445, 1995]) is considered. In this paper the operating characteristic for a sampling plan is determined for the case that a lot of products is submitted for inspection with lifetimes specified by an exponentiated log-logistic distribution (ELLD). The results are illustrated by a numerical example.

Keywords: Exponentiated log-logistic distribution; reliability test plans (search for similar items in EconPapers)
Date: 2006
References: View references in EconPapers View complete reference list from CitEc
Citations: View citations in EconPapers (6)

Downloads: (external link)
https://doi.org/10.1515/EQC.2006.279 (text/html)
For access to full text, subscription to the journal or payment for the individual article is required.

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:bpj:ecqcon:v:21:y:2006:i:2:p:279-289:n:11

Ordering information: This journal article can be ordered from
https://www.degruyter.com/journal/key/eqc/html

DOI: 10.1515/EQC.2006.279

Access Statistics for this article

Stochastics and Quality Control is currently edited by George P. Yanev

More articles in Stochastics and Quality Control from De Gruyter
Bibliographic data for series maintained by Peter Golla ().