Post-Issue Patent "Quality Control": A Comparative Study of US Patent Re-Examinations and European Patent Oppositions

Stuart Graham, Bronwyn Hall, Dietmar Harhoff () and David C. Mowery

Department of Economics, Working Paper Series from Department of Economics, Institute for Business and Economic Research, UC Berkeley

Keywords: patent system; litigation; intellectual property; opposition; re-examination; Business; Social and Behavioral Sciences; Technology and Innovation (search for similar items in EconPapers)
Date: 2002-08-05
References: Add references at CitEc
Citations: View citations in EconPapers (48)

Downloads: (external link)
https://www.escholarship.org/uc/item/2qt097bd.pdf;origin=repeccitec (application/pdf)

Related works:
Working Paper: Post-Issue Patent "Quality Control": A Comparative Study of US Patent Re-examinations and European Patent Oppositions (2003)
Working Paper: Post-Issue Patent “Quality Control:” A Comparative Study of US Patent Re-examinations and European Patent Oppositions (2002)
Working Paper: Post-Issue Patent “Quality Control:” A Comparative Study of US Patent Re-examinations and European Patent Oppositions (2002)
Working Paper: Post-Issue Patent "Quality Control": A Comparative Study of US Patent Re-examinations and European Patent Oppositions (2002)
Working Paper: Post-Issue Patent "Quality Control": A Comparative Study of US Patent Re-examinations and European Patent Oppositions (2002)
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:cdl:econwp:qt2qt097bd

Access Statistics for this paper

More papers in Department of Economics, Working Paper Series from Department of Economics, Institute for Business and Economic Research, UC Berkeley Contact information at EDIRC.
Bibliographic data for series maintained by Lisa Schiff ().