Interfacial crack front wandering: influence of quenched noise correlations

Jean Schmittbuhl and Jean-Pierre Vilotte

Physica A: Statistical Mechanics and its Applications, 1999, vol. 270, issue 1, 42-56

Abstract: We discuss the influence of spatially correlated noise on the wandering exponent of the crack-front line during slow in-plane crack propagation. For a uniform noise, the wandering exponent in the stastically stationary regime is .35±0.02, while the dynamic exponent is z=0.75±0.02. For short-range Gaussian correlations, the wandering exponent is shown to be .50±0.03 in the small fluctuation limit and .35±0.02 in the large fluctuation limit which can be shown to be consistent with the uniform case. In the case of long-range correlations, characterized by a self-affine exponent ζt, the wandering exponent is shown to scale as ζt+1 for a wide range of ζt between −1.0 and +1.0. These results are discussed with reference to recent experiments of slow in-plane crack propagation between two annealed Plexiglas blocks.

Keywords: Interfacial crack; Pinning; Roughness (search for similar items in EconPapers)
Date: 1999
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Persistent link: https://EconPapers.repec.org/RePEc:eee:phsmap:v:270:y:1999:i:1:p:42-56

DOI: 10.1016/S0378-4371(99)00155-7

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