One-shot device test data analysis using non-parametric and semi-parametric inferential methods and applications

Xiaojun Zhu and N. Balakrishnan

Reliability Engineering and System Safety, 2022, vol. 221, issue C

Abstract: A one-shot device, such as an automobile airbag, electro-explosive unit or munition, is a product that can be used only once. Its actual lifetime is unobservable, rendering the corresponding reliability analysis quite challenging. In this paper, two non-parametric methodologies—maximum likelihood estimation via EM-algorithm and Nelson–Aalen based estimation are developed for identical testing environment on one-shot devices. The EM-algorithm is usually used for unobserved failure times under some specific parametric models. But, here the EM-algorithm is adopted for the number of failures in each time interval in a non-parametric manner. Next, a semi-parametric approach, based on proportional hazards assumption, is developed for nonidentical testing environments, such as under an accelerated life-test. A Monte Carlo simulation study is then carried out for evaluating the performance of the inferential methods developed here. Finally, two data sets are analyzed for illustrative purpose.

Keywords: Accelerated life-test; Expectation–Maximization algorithm; Kaplan–Meier estimator; Nelson–Aalen estimator; Non-parametric inference; One-shot device test; Proportional hazards model; Semi-parametric inference (search for similar items in EconPapers)
Date: 2022
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Citations: View citations in EconPapers (1)

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Persistent link: https://EconPapers.repec.org/RePEc:eee:reensy:v:221:y:2022:i:c:s0951832022000011

DOI: 10.1016/j.ress.2022.108319

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