Accelerated degradation testing for lifetime analysis considering random effects and the influence of stress and measurement errors

Yang Li, Haifeng Gao, Hongtian Chen, Chun Liu, Zhe Yang and Enrico Zio

Reliability Engineering and System Safety, 2024, vol. 247, issue C

Abstract: This paper is focused on lifetime analysis based on accelerated degradation testing (ADT), considering the influence of stress and measurement errors. The traditional approach of ADT does not consider the random effects due to the influence of stress and measurement errors, and this can lead to inaccurate lifetime predictions. For this reason, we propose an ADT model that accounts for random effects. The model is based on Wiener process, which quantitatively expresses the relationship between the parameters of the ADT model and stress, as well as takes the measurement errors into consideration. Then, the proposed model is extrapolated to normal stress for lifetime analysis and a closed-form expression is deduced. Finally, ADT of the electrical cables is considered as case study to validate the effectiveness of the proposed algorithm.

Keywords: Lifetime analysis; Accelerated degradation testing; Random effects; Stress; Measurement errors; Wiener process (search for similar items in EconPapers)
Date: 2024
References: View references in EconPapers View complete reference list from CitEc
Citations: View citations in EconPapers (3)

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Persistent link: https://EconPapers.repec.org/RePEc:eee:reensy:v:247:y:2024:i:c:s0951832024001753

DOI: 10.1016/j.ress.2024.110101

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