Diagnostics of PID Early Stage in PV Systems

Tomáš Finsterle, Ladislava Černá, Pavel Hrzina, David Rokusek and Vítězslav Benda
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Tomáš Finsterle: Department of Electrotechnology, Faculty of Electrical Engineering, Czech Technical University in Prague, Technicka 2, 166 27 Prague, Czech Republic
Ladislava Černá: Department of Electrotechnology, Faculty of Electrical Engineering, Czech Technical University in Prague, Technicka 2, 166 27 Prague, Czech Republic
Pavel Hrzina: Department of Electrotechnology, Faculty of Electrical Engineering, Czech Technical University in Prague, Technicka 2, 166 27 Prague, Czech Republic
David Rokusek: Department of Electrotechnology, Faculty of Electrical Engineering, Czech Technical University in Prague, Technicka 2, 166 27 Prague, Czech Republic
Vítězslav Benda: Department of Electrotechnology, Faculty of Electrical Engineering, Czech Technical University in Prague, Technicka 2, 166 27 Prague, Czech Republic

Energies, 2021, vol. 14, issue 8, 1-15

Abstract: Potential induced degradation (PID) is a serious threat for the photovoltaic (PV) industry. The risk of PID may increase with increasing operating voltage of PV systems. Although PID tests are currently standard tests, the expansion of floating PV power plants and installation in humid climates show that PID-free modules are still sensitive to this type of degradation. Therefore, a method that can detect PID in the initial phase before standard tests reveal it, is necessary to increase the reliability of PV systems and maintain their lifetime. One possible tool for revealing early-stage PID manifestations is impedance spectroscopy and I-V dark curves measurements. Both IS and dark current measurement methods are sensitive to cell shunt resistance ( R SH ), which is strongly influenced by PID before significant power loss and can act as an early stage PID detection mechanism. The paper describes the differences of the common P-type PV module parameters both during the degradation process and also during the regeneration process when diagnosed by conventional and IS and dark current measurement methods.

Keywords: potential-induced degradation; impedance characteristics; diagnostics of photovoltaic module defects (search for similar items in EconPapers)
JEL-codes: Q Q0 Q4 Q40 Q41 Q42 Q43 Q47 Q48 Q49 (search for similar items in EconPapers)
Date: 2021
References: View references in EconPapers View complete reference list from CitEc
Citations: View citations in EconPapers (1)

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