Power Hardware in-the-Loop Testing to Analyze Fault Behavior of Smart Inverters in Distribution Networks

Taha Selim Ustun, Shuichi Sugahara, Masaichi Suzuki, Jun Hashimoto and Kenji Otani
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Taha Selim Ustun: Fukushima Renewable Energy Institute, AIST (FREA), National Institute of Advanced Industrial Science and Technology (AIST), Koriyama 963-0298, Japan
Shuichi Sugahara: Fukushima Renewable Energy Institute, AIST (FREA), National Institute of Advanced Industrial Science and Technology (AIST), Koriyama 963-0298, Japan
Masaichi Suzuki: Fukushima Renewable Energy Institute, AIST (FREA), National Institute of Advanced Industrial Science and Technology (AIST), Koriyama 963-0298, Japan
Jun Hashimoto: Fukushima Renewable Energy Institute, AIST (FREA), National Institute of Advanced Industrial Science and Technology (AIST), Koriyama 963-0298, Japan
Kenji Otani: Fukushima Renewable Energy Institute, AIST (FREA), National Institute of Advanced Industrial Science and Technology (AIST), Koriyama 963-0298, Japan

Sustainability, 2020, vol. 12, issue 22, 1-18

Abstract: Deep penetration of distributed generators have created several stability and operation issues for power systems. In order to address these, inverters with advanced capabilities such as frequency and reactive power support the grid. Known also as Smart Inverters (SIs), these devices are highly dynamic and contribute to the power flow in the system. Notwithstanding their benefits, such dynamic devices are new to distribution networks. Power system operators are very reluctant toward such changes as they may cause unknown issues. In order to alleviate these concerns and facilitate SIs integration to the grid, behavior studies are required. To that end, this paper presents a power hardware-in-the-loop test set up and tests that are performed to study fault behavior of SIs connected to distribution networks. The details of the software model, SI integration with the real-time simulator, test results, and their analyses are presented. This experience shows that it is not trivial to connect such novel devices with simulation environments. Adjustments are required on both software and hardware fronts on a case-by-case basis. The encountered integration issues and their solutions are presented herein. The fault behavior of the SI with respect to the fault location is documented. It is observed that for faults that are close to SIs, momentary cessation of generation is observed. This needs to be tackled by device manufacturers as this phenomenon is very detrimental to health of a power system under fault conditions. Extensive PHIL test results show that several factors affect the fault behavior of an SI: fault location and its duration, SI mode of operation as well as extra devices housed in the casing. These results and their in-depth analyses are presented for a thorough understanding of SI behavior under fault conditions.

Keywords: grid integration studies; lab testing set up; grid simulators; fault behavior; distribution network fault studies (search for similar items in EconPapers)
JEL-codes: O13 Q Q0 Q2 Q3 Q5 Q56 (search for similar items in EconPapers)
Date: 2020
References: View references in EconPapers View complete reference list from CitEc
Citations: View citations in EconPapers (2)

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