EconPapers    
Economics at your fingertips  
 

Specification tests of parametric dynamic conditional quantiles

Juan Carlos Escanciano and Carlos Velasco

Post-Print from HAL

Abstract: This article proposes omnibus specification tests of parametric dynamic quantile models. Contrary to the existing procedures, we allow for a flexible specification, where a possibly continuum of quantiles are simultaneously specified under fairly weak conditions on the serial dependence in the underlying data generating process. Since the null limit distribution of tests is not pivotal, we propose a subsampling approximation of the asymptotic critical values. A Monte Carlo study shows that the asymptotic results provide good approximations for small sample sizes. Finally, an application suggests that our methodology is a powerful alternative to standard backtesting procedures in evaluating market risk.

Keywords: C12; C22; Omnibus tests; Conditional quantiles; Nonlinear time series; Empirical processes; Quantile processes; Subsampling; Value-at-risk; Tail risk (search for similar items in EconPapers)
Date: 2010-09-15
Note: View the original document on HAL open archive server: https://hal.science/hal-00732534
References: View references in EconPapers View complete reference list from CitEc
Citations: View citations in EconPapers (25)

Published in Econometrics, 2010, 159 (1), pp.209. ⟨10.1016/j.jeconom.2010.06.003⟩

Downloads: (external link)
https://hal.science/hal-00732534/document (application/pdf)

Related works:
Journal Article: Specification tests of parametric dynamic conditional quantiles (2010) Downloads
Working Paper: Specification Tests of Parametric Dynamic Conditional Quantiles (2008) Downloads
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:hal:journl:hal-00732534

DOI: 10.1016/j.jeconom.2010.06.003

Access Statistics for this paper

More papers in Post-Print from HAL
Bibliographic data for series maintained by CCSD ().

 
Page updated 2025-03-19
Handle: RePEc:hal:journl:hal-00732534