Economic Complexity and Industrial Upgrading in the Product Space Network - Opportunities for the City of Laval, Canada
Yihan Wang () and
Ekaterina Turkina ()
Additional contact information
Yihan Wang: HEC Montréal - HEC Montréal, Métis Lab EM Normandie - EM Normandie - École de Management de Normandie = EM Normandie Business School
Ekaterina Turkina: HEC Montréal - HEC Montréal
Post-Print from HAL
Abstract:
This paper studies a city-region's multi-level competitiveness based on the configurations of local product space network and agglomeration of Revealed Competitive Advantage (RCA) sectors. We undertake a mandate studying the economic complexity of the City of Laval and explore the opportunities of industrial upgrading in its product space network. Addressing the importance of subnational analysis of economic complexity, we find the divergence of a city-region's RCA sectors at regional, national and global levels. We also imply the contribution of the structural holes of a cityregion's product space network across RCA sectors as potential fields to attract FDI inflow and enhance economic growth. Then, we discover the correlated spatial agglomeration of RCA and structural hole sectors within a city-region's hierarchical ecosystem. Finally, we conclude the practical implications for policy makers and discusses future research directions.
Date: 2020-11-24
New Economics Papers: this item is included in nep-net and nep-ure
Note: View the original document on HAL open archive server: https://hal.science/hal-03206772v1
References: View references in EconPapers View complete reference list from CitEc
Citations: View citations in EconPapers (2)
Published in Rethinking Cluster 2020 Conference, Nov 2020, Valencia, Spain
Downloads: (external link)
https://hal.science/hal-03206772v1/document (application/pdf)
Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.
Export reference: BibTeX
RIS (EndNote, ProCite, RefMan)
HTML/Text
Persistent link: https://EconPapers.repec.org/RePEc:hal:journl:hal-03206772
Access Statistics for this paper
More papers in Post-Print from HAL
Bibliographic data for series maintained by CCSD ().