Visible to mid-infrared giant in-plane optical anisotropy in ternary van der Waals crystals

Yanze Feng, Runkun Chen, Junbo He, Liujian Qi, Yanan Zhang, Tian Sun, Xudan Zhu, Weiming Liu, Weiliang Ma, Wanfu Shen, Chunguang Hu, Xiaojuan Sun, Dabing Li (), Rongjun Zhang (), Peining Li () and Shaojuan Li ()
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Yanze Feng: Chinese Academy of Sciences
Runkun Chen: Huazhong University of Science and Technology
Junbo He: Fudan University
Liujian Qi: Chinese Academy of Sciences
Yanan Zhang: Chinese Academy of Sciences
Tian Sun: Huazhong University of Science and Technology
Xudan Zhu: Fudan University
Weiming Liu: Fudan University
Weiliang Ma: Huazhong University of Science and Technology
Wanfu Shen: Tianjin University
Chunguang Hu: Tianjin University
Xiaojuan Sun: Chinese Academy of Sciences
Dabing Li: Chinese Academy of Sciences
Rongjun Zhang: Fudan University
Peining Li: Huazhong University of Science and Technology
Shaojuan Li: Chinese Academy of Sciences

Nature Communications, 2023, vol. 14, issue 1, 1-8

Abstract: Abstract Birefringence is at the heart of photonic applications. Layered van der Waals materials inherently support considerable out-of-plane birefringence. However, funnelling light into their small nanoscale area parallel to its out-of-plane optical axis remains challenging. Thus far, the lack of large in-plane birefringence has been a major roadblock hindering their applications. Here, we introduce the presence of broadband, low-loss, giant birefringence in a biaxial van der Waals materials Ta2NiS5, spanning an ultrawide-band from visible to mid-infrared wavelengths of 0.3–16 μm. The in-plane birefringence Δn ≈ 2 and 0.5 in the visible and mid-infrared ranges is one of the highest among van der Waals materials known to date. Meanwhile, the real-space propagating waveguide modes in Ta2NiS5 show strong in-plane anisotropy with a long propagation length (>20 μm) in the mid-infrared range. Our work may promote next-generation broadband and ultracompact integrated photonics based on van der Waals materials.

Date: 2023
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DOI: 10.1038/s41467-023-42567-x

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