Insights into structural defect formation in individual InP/ZnSe/ZnS quantum dots under UV oxidation
Hayeon Baek,
Sungsu Kang,
Junyoung Heo,
Soonmi Choi,
Ran Kim,
Kihyun Kim,
Nari Ahn,
Yeo-Geon Yoon,
Taekjoon Lee,
Jae Bok Chang,
Kyung Sig Lee,
Young-Gil Park () and
Jungwon Park ()
Additional contact information
Hayeon Baek: Seoul National University
Sungsu Kang: Seoul National University
Junyoung Heo: Samsung Display Co., Ltd.
Soonmi Choi: Samsung Display Co., Ltd.
Ran Kim: Samsung Display Co., Ltd.
Kihyun Kim: Samsung Display Co., Ltd.
Nari Ahn: Samsung Display Co., Ltd.
Yeo-Geon Yoon: Samsung Display Co., Ltd.
Taekjoon Lee: Samsung Display Co., Ltd.
Jae Bok Chang: Samsung Display Co., Ltd.
Kyung Sig Lee: Samsung Display Co., Ltd.
Young-Gil Park: Samsung Display Co., Ltd.
Jungwon Park: Seoul National University
Nature Communications, 2024, vol. 15, issue 1, 1-10
Abstract:
Abstract InP/ZnSe/ZnS quantum dots (QDs) stand as promising candidates for advancing QD-organic light-emitting diodes (QLED), but low emission efficiency due to their susceptibility to oxidation impedes applications. Structural defects play important roles in the emission efficiency degradation of QDs, but the formation mechanism of defects in oxidized QDs has been less investigated. Here, we investigated the impact of diverse structural defects formation on individual QDs and propagation during UV-facilitated oxidation using high-resolution (scanning) transmission electron microscopy. UV-facilitated oxidation of the QDs alters shell morphology by the formation of surface oxides, leaving ZnSe surfaces poorly passivated. Further oxidation leads to the formation of structural defects, such as dislocations, and induces strain at the oxide-QD interfaces, facilitating In diffusion from the QD core. These changes in the QD structures result in emission quenching. This study provides insight into the formation of structural defects through photo-oxidation, and their effects on emission properties of QDs.
Date: 2024
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Persistent link: https://EconPapers.repec.org/RePEc:nat:natcom:v:15:y:2024:i:1:d:10.1038_s41467-024-45944-2
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DOI: 10.1038/s41467-024-45944-2
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