Mechanically induced correlated errors on superconducting qubits with relaxation times exceeding 0.4 ms

Shingo Kono (), Jiahe Pan, Mahdi Chegnizadeh, Xuxin Wang, Amir Youssefi, Marco Scigliuzzo and Tobias J. Kippenberg ()
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Shingo Kono: Swiss Federal Institute of Technology Lausanne (EPFL)
Jiahe Pan: Swiss Federal Institute of Technology Lausanne (EPFL)
Mahdi Chegnizadeh: Swiss Federal Institute of Technology Lausanne (EPFL)
Xuxin Wang: Swiss Federal Institute of Technology Lausanne (EPFL)
Amir Youssefi: Swiss Federal Institute of Technology Lausanne (EPFL)
Marco Scigliuzzo: Swiss Federal Institute of Technology Lausanne (EPFL)
Tobias J. Kippenberg: Swiss Federal Institute of Technology Lausanne (EPFL)

Nature Communications, 2024, vol. 15, issue 1, 1-12

Abstract: Abstract Superconducting qubits are among the most advanced candidates for achieving fault-tolerant quantum computing. Despite recent significant advancements in the qubit lifetimes, the origin of the loss mechanism for state-of-the-art qubits is still subject to investigation. Furthermore, the successful implementation of quantum error correction requires negligible correlated errors between qubits. Here, we realize long-lived superconducting transmon qubits that exhibit fluctuating lifetimes, averaging 0.2 ms and exceeding 0.4 ms – corresponding to quality factors above 5 million and 10 million, respectively. We then investigate their dominant error mechanism. By introducing novel time-resolved error measurements that are synchronized with the operation of the pulse tube cooler in a dilution refrigerator, we find that mechanical vibrations from the pulse tube induce nonequilibrium dynamics in highly coherent qubits, leading to their correlated bit-flip errors. Our findings not only deepen our understanding of the qubit error mechanisms but also provide valuable insights into potential error-mitigation strategies for achieving fault tolerance by decoupling superconducting qubits from their mechanical environments.

Date: 2024
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DOI: 10.1038/s41467-024-48230-3

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