A bulk Schottky junction for high-sensitivity portable radiation detectors

Yihan Zhang, Zongming Huang, Chenchen Peng, Ning Gao, Xie George Xu, Yaping Li, Cheng Zheng, Wenjing Chen, Yidong Yang, Jingjing Zhao, Junjie Yang, Tao Chen and Zhengguo Xiao ()
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Yihan Zhang: University of Science and Technology of China
Zongming Huang: University of Science and Technology of China
Chenchen Peng: University of Science and Technology of China
Ning Gao: University of Science and Technology of China
Xie George Xu: University of Science and Technology of China
Yaping Li: University of Science and Technology of China
Cheng Zheng: University of Science and Technology of China
Wenjing Chen: University of Science and Technology of China
Yidong Yang: University of Science and Technology of China
Jingjing Zhao: Southwest University
Junjie Yang: University of Science and Technology of China
Tao Chen: University of Science and Technology of China
Zhengguo Xiao: University of Science and Technology of China

Nature Communications, 2024, vol. 15, issue 1, 1-9

Abstract: Abstract The thickness of X-ray detectors needs to reach hundreds of micrometers to absorb X-ray, and therefore, high voltages over tens or hundreds of volts should be applied to extract X-ray-generated carriers. Here, we propose a bulk Schottky junction for X-ray detection using interpenetrated macroporous-carbon electrodes and metal-halide perovskite networks. The X-ray-generated holes are extracted by the macroporous-carbon electrodes under the built-in electric field, while the electrons in the perovskite phase result in a high gain effect. A high sensitivity of 1.42×105 μC Gyair−1 cm−2 and a low detection limit of 48 nGyair s−1 at a low voltage of −1 V are achieved. We fabricated a dry battery-powered portable X-ray alarm prototype. The pixel detector shows a decent stability under X-ray exposure, and a spatial resolution of up to 5.0 lp mm−1, and the detector arrays also exhibit remarkable uniformity, demonstrating its potential application in X-ray imaging.

Date: 2024
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DOI: 10.1038/s41467-024-54594-3

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