Synchrotron X-ray diffraction study of SrRuO 3 /SrTiO 3 /SrRuO 3 nano-sized heterostructures grown by laser MBE

C. Aruta (), M. Angeloni, G. Balestrino, P. G. Medaglia, P. Orgiani, A. Tebano and J. Zegenhagen

The European Physical Journal B: Condensed Matter and Complex Systems, 2005, vol. 46, issue 2, 251-255

Abstract: Structural investigation using X-ray synchrotron radiation has been performed on SrRuO 3 /SrTiO 3 /SrRuO 3 epitaxial heterostructures, with each constituent layer a few unit cell thick grown on (001) SrTiO 3 substrate. Detailed information on the evolution of the in-plane lattice structure has been obtained, in these heterostructures, by grazing incidence diffraction measurements. The samples have been grown by low-pressure pulsed laser deposition. Under our deposition conditions, SrRuO 3 layers grow with an elongated cell perpendicular to the substrate surface. The in-plane pseudocubic lattice parameters do not match the in-plane square SrTiO 3 structure even in the case of very thin SrRuO 3 layers. Such a distortion was found to decrease with increasing the thickness of the SrTiO 3 barrier layer. Copyright EDP Sciences/Società Italiana di Fisica/Springer-Verlag 2005

Date: 2005
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DOI: 10.1140/epjb/e2005-00248-6

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