Strong water repellency effect on SiO 2 films processed at a nanometric scale

S. M.M. Ramos (), A. Benyagoub, B. Canut, P. De Dieuleveult and G. Messin

The European Physical Journal B: Condensed Matter and Complex Systems, 2008, vol. 62, issue 4, 405-410

Abstract: The present study deals with the creation of nano-rough surfaces with stable and controlled high hydrophobicity. These surfaces were obtained by combining the ion track etching technique with a simple functionalization by grafting perfluoroctyltrichlorosilane (PFOTS) molecules. Surface morphology was investigated by AFM observations which evidenced a self-affine fractal structure with a fractal dimension D f ~ 2.6. The study of the wetting properties of these surfaces allowed to elucidate the conditions for observing a high hydrophobicity phenomenon and to predict the contact angle values for surfaces designed at a nanometric scale. Copyright EDP Sciences/Società Italiana di Fisica/Springer-Verlag 2008

Keywords: 68.08.Bc Wetting; 61.46.-w Nanoscale materials; 81.07.-b Nanoscale materials and structures: fabrication and characterization; 61.80.-x Physical radiation effects; radiation damage (search for similar items in EconPapers)
Date: 2008
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DOI: 10.1140/epjb/e2008-00182-1

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