A model-based standardization approach that separates true bias/DIF from group ability differences and detects test bias/DTF as well as item bias/DIF

Robin Shealy and William Stout

Psychometrika, 1993, vol. 58, issue 2, 159-194

Keywords: item bias; test bias; DIF; differential test functioning; DTF; SIB; SIBTEST; standardization; simultaneous items bias; valid subtest; bias/DIF; Mantel-Haenszel (search for similar items in EconPapers)
Date: 1993
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Citations: View citations in EconPapers (18)

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DOI: 10.1007/BF02294572

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