Credit ratings and credit risk
Jens Hilscher and
Mungo Wilson ()
Additional contact information
Mungo Wilson: University of Oxford
No 31, Working Papers from Brandeis School of Business and Economics
Abstract:
This paper investigates the information in corporate credit ratings. We examine the extent to which firms' credit ratings measure raw probability of default as opposed to systematic risk of default, a firm's tendency to default in bad times. We find that credit ratings are dominated as predictors of corporate failure by a simple model based on publicly available financial information (`failure score'), indicating that ratings are poor measures of raw default probability. However, ratings are strongly related to a straightforward measure of systematic default risk: the sensitivity of firm default probability to its common component (`failure beta'). Furthermore, this systematic risk measure is strongly related to credit default swap risk premia. Our findings can explain otherwise puzzling qualities of ratings.
Keywords: Credit Rating; Credit Risk; Default Probability; Forecast Accuracy; Systematic Default Risk (search for similar items in EconPapers)
JEL-codes: G12 G24 G33 (search for similar items in EconPapers)
Pages: 54 pages
Date: 2011-06
New Economics Papers: this item is included in nep-ban, nep-bec, nep-cfn and nep-rmg
References: View references in EconPapers View complete reference list from CitEc
Citations: View citations in EconPapers (6)
Downloads: (external link)
http://www.brandeis.edu/economics/RePEc/brd/doc/Brandeis_WP31.pdf First version, 2011 (application/pdf)
Our link check indicates that this URL is bad, the error code is: 403 Forbidden
Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.
Export reference: BibTeX
RIS (EndNote, ProCite, RefMan)
HTML/Text
Persistent link: https://EconPapers.repec.org/RePEc:brd:wpaper:31
Access Statistics for this paper
More papers in Working Papers from Brandeis School of Business and Economics Contact information at EDIRC.
Bibliographic data for series maintained by Pin-Lun Lee ().