Towards a theory of confidence intervals for system reliability

Laurence A. Baxter

Statistics & Probability Letters, 1993, vol. 16, issue 1, 29-38

Abstract: Consider a binary coherent system of nonrepairable components, the lifelength distributions of which lie in the single parameter exponential family of distributions. Given observations of the lifelengths of the constituent components, it is shown how inversion of the likelihood ratio test can be used to calculate strongly consistent approximate confidence intervals for the survivor function of the system lifelength and for the mean time to system failure.

Keywords: Binary; coherent; structure; function; reliability; function; likelihood; ratio; test; exponential; family; of; distributions; sufficient; statistic; confidence; interval; chi-square; distribution; mean; time; to; failure (search for similar items in EconPapers)
Date: 1993
References: Add references at CitEc
Citations:

Downloads: (external link)
http://www.sciencedirect.com/science/article/pii/0167-7152(93)90118-3
Full text for ScienceDirect subscribers only

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:eee:stapro:v:16:y:1993:i:1:p:29-38

Ordering information: This journal article can be ordered from
http://www.elsevier.com/wps/find/supportfaq.cws_home/regional
https://shop.elsevie ... _01_ooc_1&version=01

Access Statistics for this article

Statistics & Probability Letters is currently edited by Somnath Datta and Hira L. Koul

More articles in Statistics & Probability Letters from Elsevier
Bibliographic data for series maintained by Catherine Liu ().