A stratified sampling model in spherical feature inspection using coordinate measuring machines

Kai-Tai Fang, Song-Gui Wang and Gang Wei

Statistics & Probability Letters, 2001, vol. 51, issue 1, 25-34

Abstract: A coordinate measuring machine (CMM) is a computer-controlled device that uses a probe to obtain measurements on a manufactured part's surface. In the process of collecting, analyzing and interpreting CMM data, many statistical problems arise. One of them is to choose a model describing the relationship between the location and shape parameters of the part and CMM data and representing the effects of the various sources of randomness of these data. This article suggests a linear model for a stratified sampling scheme, which is one of the most commonly discussed in the CMM literature, in fitting a spherical surface. A feasible generalized least-squares estimator of the part's spherical parameter set is given and its property is studied. Our theoretical results indicate that stratified sampling performs better than random sampling. A similar conclusion was also obtained by Caskey et al. (1990, Design Manufacturing Systems Conf. 779-786) and Xu (1992, M.S. thesis, University of Texas - EI Paso, Mechanical and Industrial Engineering Department, unpublished) using the Monte Carlo experiments for some quite different situations.

Keywords: Stratified; sampling; Coordinate; measuring; machine; Computer; aided; design; Linear; model; Random; effect (search for similar items in EconPapers)
Date: 2001
References: View references in EconPapers View complete reference list from CitEc
Citations:

Downloads: (external link)
http://www.sciencedirect.com/science/article/pii/S0167-7152(00)00133-4
Full text for ScienceDirect subscribers only

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:eee:stapro:v:51:y:2001:i:1:p:25-34

Ordering information: This journal article can be ordered from
http://www.elsevier.com/wps/find/supportfaq.cws_home/regional
https://shop.elsevie ... _01_ooc_1&version=01

Access Statistics for this article

Statistics & Probability Letters is currently edited by Somnath Datta and Hira L. Koul

More articles in Statistics & Probability Letters from Elsevier
Bibliographic data for series maintained by Catherine Liu ().