Research on the Influence of Typical Soil Parameters on Critical Breakdown Field Strength and Residual Resistivity Based on Discharge Topography

Donghui Luo, Jialun Li, Yongxing Cao, Bo Tan, Wei Li and Hanyu Wang
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Donghui Luo: State Grid Sichuan Electric Power Research Institute, Chengdu 610041, China
Jialun Li: State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, Chongqing 400044, China
Yongxing Cao: State Grid Sichuan Electric Power Research Institute, Chengdu 610041, China
Bo Tan: China Electric Power Research Institute Co., Ltd., Wuhan 430000, China
Wei Li: State Grid Shanxi Electric Power Research Institute, Xi’an 710000, China
Hanyu Wang: State Grid Sichuan Electric Power Company, Chengdu 610041, China

Energies, 2021, vol. 14, issue 16, 1-14

Abstract: Partial discharge of soil occurs when a lightning current enters the ground, and the strength of partial discharge is closely related to the magnitude of its critical breakdown field strength. Therefore, how to accurately obtain the variation law of the typical soil critical breakdown field strength and residual resistivity is the key to realizing the safe operation of the grounding devices and cables in the ground. This paper first selects a variety of typical soils to study the influence of various factors on the morphology of the discharge channel, and then studies the calculation methods of the soil critical breakdown field strength and residual resistivity under the introduction of different discharge channel morphologies and structures, and further discusses the reason why typical soil media factors have a small impact on the critical breakdown field. The experimental results show that under the same conditions, the critical breakdown field strengths of different soils from small to large are sand soil, loam soil and Yellow cinnamon soil. The largest ratio of residual resistivity to initial resistivity of the three soils is sand soil.

Keywords: discharge channel morphology characteristics; critical breakdown field strength; residual resistivity; X-ray imaging technology (search for similar items in EconPapers)
JEL-codes: Q Q0 Q4 Q40 Q41 Q42 Q43 Q47 Q48 Q49 (search for similar items in EconPapers)
Date: 2021
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