Frequency Domain Reflectometry for Power Cable Defect Localization: A Comparative Study of FFT and IFFT Methods

Wenbo Zhu, Baojun Hui, Jianda Li (), Tao Han, Linjie Zhao and Shuai Hou
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Wenbo Zhu: High Voltage Technology Institute, CSG Electric Power Research Institute Co., Ltd., Guangzhou 510663, China
Baojun Hui: High Voltage Technology Institute, CSG Electric Power Research Institute Co., Ltd., Guangzhou 510663, China
Jianda Li: School of Electrical and Information Engineering, Tianjin University, Tianjin 300072, China
Tao Han: School of Electrical and Information Engineering, Tianjin University, Tianjin 300072, China
Linjie Zhao: High Voltage Technology Institute, CSG Electric Power Research Institute Co., Ltd., Guangzhou 510663, China
Shuai Hou: High Voltage Technology Institute, CSG Electric Power Research Institute Co., Ltd., Guangzhou 510663, China

Energies, 2025, vol. 18, issue 20, 1-17

Abstract: At present, the development of power cables shows three notable trends: higher voltage, longer distance and more complex environments. Against this backdrop, the limitations of traditional detection techniques in locating local defects have become increasingly apparent. Frequency Domain Reflectometry (FDR) has garnered sustained research attention both domestically and internationally due to its high sensitivity and accuracy in detecting localized defects. This paper aims to compare the defect localization effectiveness of the Fast Fourier Transform (FFT) method and the Inverse Fast Fourier Transform (IFFT) method within FDR. First, the differences between the two methods are analyzed from a theoretical perspective. Then, field tests are conducted on cables of varying voltage levels and lengths, with comparisons made using parameters such as full width at half maximum (FWHM) and signal-to-noise ratio (SNR). The results indicate that the FFT method is more suitable for low-interference or short cables, while the IFFT method is more suitable for high-noise, high-resolution, or long cables.

Keywords: power cable; localized defect detection; frequency domain reflectometry (FDR) (search for similar items in EconPapers)
JEL-codes: Q Q0 Q4 Q40 Q41 Q42 Q43 Q47 Q48 Q49 (search for similar items in EconPapers)
Date: 2025
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