Deep Learning-Based Back-Projection Parameter Estimation for Quantitative Defect Assessment in Single-Framed Endoscopic Imaging of Water Pipelines

Gaon Kwon and Young Hwan Choi ()
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Gaon Kwon: Department of Civil and Infrastructure Engineering, Gyeongsang National University, Jinju-si 52725, Republic of Korea
Young Hwan Choi: Department of Civil and Infrastructure Engineering, Gyeongsang National University, Jinju-si 52725, Republic of Korea

Mathematics, 2025, vol. 13, issue 20, 1-17

Abstract: Aging water pipelines are increasingly prone to structural failure, leakage, and ground subsidence, creating critical risks to urban infrastructure. Closed-circuit television endoscopy is widely used for internal assessment, but it depends on manual interpretation and lacks reliable quantitative defect information. Traditional vanishing point detection techniques, such as the Hough Transform, often fail under practical conditions due to irregular lighting, debris, and deformed pipe surfaces, especially when pipes are water-filled. To overcome these challenges, this study introduces a deep learning-based method that estimates inverse projection parameters from monocular endoscopic images. The proposed approach reconstructs a spatially accurate two-dimensional projection of the pipe interior from a single frame, enabling defect quantification for cracks, scaling, and delamination. This eliminates the need for stereo cameras or additional sensors, providing a robust and cost-effective solution compatible with existing inspection systems. By integrating convolutional neural networks with geometric projection estimation, the framework advances computational intelligence applications in pipeline condition monitoring. Experimental validation demonstrates high accuracy in pose estimation and defect size recovery, confirming the potential of the system for automated, non-disruptive pipeline health evaluation.

Keywords: water pipeline condition assessment; endoscopic image analysis; inverse projection parameter estimation; quantitative defect evaluation; AI-based vision processing (search for similar items in EconPapers)
JEL-codes: C (search for similar items in EconPapers)
Date: 2025
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