Edge-Aware Illumination Enhancement for Fine-Grained Defect Detection on Railway Surfaces

Geuntae Bae, Sungan Yoon and Jeongho Cho ()
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Geuntae Bae: Department of Electrical Engineering, Soonchunhyang University, Asan 31538, Republic of Korea
Sungan Yoon: Department of Electrical Engineering, Soonchunhyang University, Asan 31538, Republic of Korea
Jeongho Cho: Department of Electrical Engineering, Soonchunhyang University, Asan 31538, Republic of Korea

Mathematics, 2025, vol. 13, issue 23, 1-22

Abstract: Fine-grained defects on rail surfaces are often inadequately detected by conventional vision-based object detection models in low-light environments. Although this problem can be mitigated by enhancing image brightness and contrast or employing deep learning-based object detectors, these methods frequently distort critical edge and texture information essential for accurate defect recognition. Herein, we propose a preprocessing framework that integrates two complementary modules, namely adaptive illumination enhancement (AIE) and EdgeSeal enhancement (ESE). AIE leverages contrast-limited adaptive histogram equalization and gamma correction to enhance local contrast while adjusting the global brightness distribution. ESE further refines defect visibility through morphological closing and sharpening, enhancing edge continuity and structural clarity. When integrated with the You Only Look Once v11 (YOLOv11) object detection model and evaluated on a rail defect dataset, the proposed framework achieves an ~7% improvement in mean average precision over baseline YOLOv11 and outperforms recent state-of-the-art detectors under diverse low-light and degraded-visibility conditions. The improved precision and recall across three defect classes (defects, dirt, and gaps) demonstrate the robustness of our approach. The proposed framework holds promise for real-time railway infrastructure monitoring and automation systems and is broadly applicable to low-light object detection tasks across other industrial domains.

Keywords: rail surface defect; low-light image enhancement; object detection; edge preservation (search for similar items in EconPapers)
JEL-codes: C (search for similar items in EconPapers)
Date: 2025
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