EconPapers    
Economics at your fingertips  
 

How well-rewarded is inter-firm mobility in the labour market for scientists and engineers? New evidence from the UK and France

Geoff Mason and Hiroatsu Nohara
Additional contact information
Geoff Mason: NIESR - National Institute of Economic and Social Research - Independent economic research institute

Post-Print from HAL

Abstract: As firms have come under increasing competitive pressure to acquire and make effective use of knowledge that has been generated beyond their own boundaries, they are making increasing use of external recruitment of experienced scientists and engineers (SEs) who bring with them skills and knowledge gained in the process of working for other firms. This paper explores the impact of these developments on the returns to inter-firm mobility for individual SEs in the UK and France and finds that average returns to prior experience now match the returns to tenure over a large portion of scientists' and engineers' careers in both countries. The paper discusses some possible reasons for the similarity of labour market outcomes in the two countries, which is rather surprising given the much greater mobility of SEs in the UK compared with France

Keywords: professional labour markets; job mobility; wage differentials; marché du travail professionnel; ingénieur; scientifique; mobilité; salaire (search for similar items in EconPapers)
Date: 2010-07-05
References: Add references at CitEc
Citations:

Published in Economics of Innovation and New Technology, 2010, 19 (5), pp.459 - 480. ⟨10.1080/10438590903432897⟩

There are no downloads for this item, see the EconPapers FAQ for hints about obtaining it.

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:hal:journl:halshs-00505569

DOI: 10.1080/10438590903432897

Access Statistics for this paper

More papers in Post-Print from HAL
Bibliographic data for series maintained by CCSD ().

 
Page updated 2025-03-19
Handle: RePEc:hal:journl:halshs-00505569