Robust Affine Invariant Descriptors

Jianwei Yang, Zirun Chen, Wen-Sheng Chen and Yunjie Chen

Mathematical Problems in Engineering, 2011, vol. 2011, 1-15

Abstract:

An approach is developed for the extraction of affine invariant descriptors by cutting object into slices. Gray values associated with every pixel in each slice are summed up to construct affine invariant descriptors. As a result, these descriptors are very robust to additive noise. In order to establish slices of correspondence between an object and its affine transformed version, general contour (GC) of the object is constructed by performing projection along lines with different polar angles. Consequently, affine in-variant division curves are derived. A slice is formed by points fall in the region enclosed by two adjacent division curves. To test and evaluate the proposed method, several experiments have been conducted. Experimental results show that the proposed method is very robust to noise.

Date: 2011
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Persistent link: https://EconPapers.repec.org/RePEc:hin:jnlmpe:185303

DOI: 10.1155/2011/185303

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