Bipolar Log-Intensity-Variance Histogram Method for Local Image Patch Intensity Change Measurements

Han Wang, Quan Shi, Zhihuo Xu, Ming Wei and Hanseok Ko

Mathematical Problems in Engineering, 2019, vol. 2019, 1-16

Abstract:

For a fixed-position camera, the intensity changes of an image pixel are often caused by object movement or illumination change. This paper focuses on such a problem: given two adjacent local image patches, how can the causes of intensity change be determined? A bipolar log-intensity-variance histogram is proposed to describe the intensity variations on the chaos phase plot subspace. This is combined with two sigmoid functions to construct a probabilistic measure function. Experimental results show that the proposed measurements are more effective and robust than conventional methods to the cause of variation in image intensity.

Date: 2019
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Persistent link: https://EconPapers.repec.org/RePEc:hin:jnlmpe:3651529

DOI: 10.1155/2019/3651529

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