EconPapers    
Economics at your fingertips  
 

Reliability analysis for phased-mission system of supply chain based on BDD

Xueqing Tao and Yongjin Zhang

International Journal of Industrial and Systems Engineering, 2026, vol. 53, issue 2, 215-235

Abstract: Supply chain can be viewed as a network structure of member enterprises, and the evaluation of reliability behaves an important significance for improving the efficiency of management. In this paper, the supply chain is viewed as a phased-mission system (PMS), the reliability of the PMS based on the delivery time of suppliers is investigated. Consider the complexity of network structure in supply chain, the reliability model for each stage in the system is developed based on the fault tree and binary decision diagram (BDD), then the total reliability of the PMS of supply chain is deduced by simplifying the redundant structure of the fault tree, meanwhile, the flow of assessment for reliability at certain stage is also given. Finally, a numerical example is presented to validate the proposed approach. The results should be useful for evaluating the reliability and safety of a supply chain environment.

Keywords: reliability analysis; phased-mission system; PMS; supply chain reliability; binary decision diagram; BDD; network structure. (search for similar items in EconPapers)
Date: 2026
References: Add references at CitEc
Citations:

Downloads: (external link)
http://www.inderscience.com/link.php?id=154012 (text/html)
Access to full text is restricted to subscribers.

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:ids:ijisen:v:53:y:2026:i:2:p:215-235

Access Statistics for this article

More articles in International Journal of Industrial and Systems Engineering from Inderscience Enterprises Ltd
Bibliographic data for series maintained by Sarah Parker ().

 
Page updated 2026-06-17
Handle: RePEc:ids:ijisen:v:53:y:2026:i:2:p:215-235